The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2020
Filed:
Nov. 08, 2018
Institute for Information Industry, Taipei, TW;
Cheng-Juei Yu, New Taipei, TW;
Yi-Hsin Wu, New Taipei, TW;
Yin-Jing Tien, Taipei, TW;
Jui-Yu Huang, Taoyuan, TW;
Li-Jung Chen, Taipei, TW;
Institute For Information Industry, Taipei, TW;
Abstract
An apparatus and method for determining a target adjustment route for a preset control condition set of a production line are provided. The apparatus establishes at least one candidate adjustment route for the preset control condition set according to the historical control condition sets. Each candidate adjustment route includes at least one adjustment control condition set arranged in an adjustment order. Each adjustment control condition set is one of the historical control condition sets. Within the same candidate adjustment route, the historical yield related values corresponding to the adjustment control condition sets are all greater than the preset yield related value and increase in the adjustment order. Within the same candidate adjustment route, the numbers of the adjustment control condition(s) included in the adjustment sets increase in the adjustment order. The apparatus selects one of the candidate adjustment route(s) as the target adjustment route.