The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2020

Filed:

Jun. 15, 2018
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Tan Yan, Skillman, NJ (US);

Haifeng Chen, West Windsor, NJ (US);

LuAn Tang, Pennington, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 13/02 (2006.01); B01D 53/30 (2006.01); G05B 13/04 (2006.01);
U.S. Cl.
CPC ...
G05B 13/0265 (2013.01); B01D 53/30 (2013.01); G05B 13/04 (2013.01); B01D 2258/06 (2013.01);
Abstract

A computer-implemented method, system, and computer program product are provided for anomaly detection. The method includes receiving, by a processor, sensor data from a plurality of sensors in a system. The method also includes generating, by the processor, a relationship model based on the sensor data. The method additionally includes updating, by the processor, the relationship model with new sensor data. The method further includes identifying, by the processor, an anomaly based on a fused single-variant time series fitness score in the relationship model. The method also includes controlling an operation of a processor-based machine to change a state of the processor-based machine, responsive to the anomaly.


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