The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2020

Filed:

Sep. 29, 2017
Applicant:

Nikon Corporation, Tokyo, JP;

Inventor:

Yasuo Aoki, Zushi, JP;

Assignee:

NIKON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); G03F 9/00 (2006.01); G01B 11/27 (2006.01); G01B 11/00 (2006.01); H01L 21/67 (2006.01); H01L 21/68 (2006.01); G03F 7/22 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70775 (2013.01); G01B 11/00 (2013.01); G01B 11/272 (2013.01); G03F 7/22 (2013.01); G03F 7/70358 (2013.01); G03F 7/70716 (2013.01); G03F 7/70725 (2013.01); G03F 9/00 (2013.01); G03F 9/70 (2013.01); H01L 21/67259 (2013.01); H01L 21/681 (2013.01);
Abstract

A movable body apparatus that moves a substrate equipped with: a substrate holder which can move in the X-axis and the Y-axis directions; a Y coarse movement stage can move in the Y-axis direction, a first measurement system acquiring position information on the substrate holder with heads provided at the substrate holder and a scale provided at the Y coarse movement stage; a second measurement system acquiring position information on the Y coarse movement stage with heads at the Y coarse movement stage and a scale; and a control system controlling the position of the substrate holder based on position information acquired by the first and the second measurement systems, and the first measurement system irradiates a measurement beam on the scale while moving the heads in the X-axis direction, and the second measurement system irradiates a measurement beam on the scale while moving the heads in the Y-axis direction.


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