The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2020
Filed:
Dec. 27, 2017
Elenion Technologies, Llc, New York, NY (US);
Yang Liu, Elmhurst, NY (US);
Yangjin Ma, Brooklyn, NY (US);
Ran Ding, New York, NY (US);
Thomas Wetteland Baehr-Jones, Arcadia, CA (US);
Saeed Fathololoumi, San Gabriel, CA (US);
Kishore Padmaraju, New York, NY (US);
Elenion Technologies, LLC, New York, NY (US);
Abstract
Conventionally, wavelength locking and monitoring has been achieved used various components, including calibrated etalon filters, gratings, and arrays of color filters, which offer fairly bulky solutions that require complicated controls. An improved on-chip wavelength monitor comprises: a combination comb filter comprising a plurality of comb filters, each for receiving a test beams, and each comb filter including a substantially different FSR, e.g. 10× to 20× the next closest FSR. A controller dithers a phase tuning section of each comb filter to generate a maximum or minimum output in a corresponding photodetector indicative of the wavelength of the test signal.