The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2020
Filed:
Mar. 16, 2016
Dai Nippon Printing Co., Ltd., Tokyo, JP;
Mariko Hayashi, Okayama, JP;
Tomohiko Shimatsu, Kawasaki, JP;
Seiji Shinohara, Okayama, JP;
Hiroshi Nakamura, Shanghai, CN;
DAI NIPPON PRINTING CO., LTD., Tokyo, JP;
Abstract
To provide an antireflection film that is excellent in color uniformity while suppressing the reflectance. An antireflection film containing a transparent substrate having thereon a high refractive index layer and a low refractive index layer, the antireflection film having a luminous reflectance Y value, which is measured with a specimen containing the antireflection film and a black board adhered on a side of the transparent substrate opposite to the high refractive index layer through a transparent adhesive, that satisfies the following condition (1), and an a* value and a b* value of the Lab color coordinate system, which are measured with the specimen, that satisfy the particular condition: <Condition (1)> assuming that an incident angle of light incident perpendicularly on a surface of the specimen on a side of the low refractive index layer is 0 degree, when light is made incident on the specimen at an incident angle of 5 degrees, specularly reflected light of the incident light has a luminous reflectance Y value of 0.50% or less.