The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2020

Filed:

Apr. 02, 2018
Applicant:

Chevron U.s.a. Inc., San Ramon, CA (US);

Inventors:

Anandaroop Ray, Houston, TX (US);

Prasenjit Roy, Houston, TX (US);

James Magill, Perth, AU;

David Bartel, Houston, TX (US);

Reynaldo Cardona, Houston, TX (US);

Kabilan Krishnamurthy, Perth, AU;

Assignee:

CHEVRON U.S.A. INC., San Ramon, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 1/30 (2006.01); G01V 1/34 (2006.01);
U.S. Cl.
CPC ...
G01V 1/307 (2013.01); G01V 1/345 (2013.01); G01V 2210/63 (2013.01); G01V 2210/74 (2013.01);
Abstract

Systems and methods for refining estimated effects of parameters on amplitudes are disclosed. Exemplary implementations may: (a) obtain ranges of parameter values for individual parameters within a subsurface region of interest; (b) generate a first model of the subsurface region of interest; (c) calculate a synthetic seismogram from the first model to determine corresponding amplitudes; (d) store results of applying the synthetic seismogram; (e) repeat steps (b)-(d) for multiple additional models; (f) obtain a subsurface distribution; (g) apply the subsurface distribution to the multiple models and the corresponding amplitudes; (h) generate a representation; and (i) display the representation.


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