The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2020
Filed:
Oct. 26, 2015
Tetyana Vdovina, Spring, TX (US);
Reeshidev Bansal, Spring, TX (US);
Anatoly Baumstein, Houston, TX (US);
Yaxun Tang, Spring, TX (US);
Di Yang, Spring, TX (US);
Tetyana Vdovina, Spring, TX (US);
Reeshidev Bansal, Spring, TX (US);
Anatoly Baumstein, Houston, TX (US);
Yaxun Tang, Spring, TX (US);
Di Yang, Spring, TX (US);
ExxonMobil Upstream Research Company, Spring, TX (US);
Abstract
A multi-stage FWI workflow uses multiple-contaminated FWI models to predict surface-related multiples. A method embodying the present technological advancement, can include: using data with free surface multiples as input into FWI; generating a subsurface model by performing FWI with the free-surface boundary condition imposed on top of the subsurface model; using inverted model from FWI to predict multiples; removing predicted multiples from the measured data; using the multiple-free data as input into FWI with absorbing boundary conditions imposed on top of the subsurface model; and preparing a multiple free data set for use in conventional seismic data processing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile