The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2020

Filed:

May. 27, 2016
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Luke Cirillo, Poing, DE;

Andreas Lagler, Rosenheim, DE;

Clemens Lohmer, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 13/02 (2006.01); G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 13/0218 (2013.01); G01R 13/0245 (2013.01); G01R 29/0892 (2013.01);
Abstract

The invention relates to a method for investigating signal parameters in an electrical measuring device with a display element with the method steps: display of a detected signal on the display element, manual masking of at least one signal component of the signal by a user by means of a masking element of the measuring device and investigation of signal parameters from the masked signal component or from the unmasked signal component of the signal by the measuring device. At least one further signal parameter is also investigated alongside the time duration and the bandwidth of the masked signal component. According to the invention, a corresponding measuring device is also provided.


Find Patent Forward Citations

Loading…