The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2020

Filed:

Dec. 11, 2018
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Guanghua Wang, Clifton Park, NY (US);

Margeaux Wallace, Niskayuna, NY (US);

Bernard Patrick Bewlay, Niskayuna, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/95 (2006.01); G01N 21/956 (2006.01); G01N 21/88 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G01N 21/95607 (2013.01); G01N 21/8806 (2013.01); G06T 7/001 (2013.01); G06T 2207/30156 (2013.01);
Abstract

An inspection system includes a light source, an imaging device, and one or more processors. The light source is configured to direct an illumination light having a controlled light characteristic towards a surface of a thermal barrier coating of a work piece. The imaging device is configured to capture image data of the surface of the thermal barrier coating by monitoring the illumination light reflected off the surface. The one or more processors are operably connected to the imaging device and configured to analyze the image data of the surface by comparing the image data to reference image data depicting a first designated microstructure. The first designated microstructure has an associated coating quality value. The one or more processors are configured to determine that the thermal barrier coating of the work piece has the first designated microstructure based on the analysis.


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