The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2020
Filed:
Nov. 16, 2018
Hamamatsu Photonics K.k., Hamamatsu-shi, Shizuoka, JP;
Yoichi Kawada, Hamamatsu, JP;
HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
In an optical analysis device, a terahertz wave generation module includes a terahertz wave generation unit, and a polarization switching unit that periodically switches a polarization state of a terahertz wave between a first polarization state and a second polarization state that are different from each other on the basis of a frequency signal. An electric field vector measurement unit detects a first electric field vector of a terahertz wave in a first polarization state and a second electric field vector of the terahertz wave in a second polarization state by referring to a frequency signal. An optical parameter analysis unit determines an optical parameter of a measurement target from an intersection between first analysis data based on spectral data obtained by performing Fourier transformation on a product of the first electric field vector and a rotation matrix and second analysis data based on spectral data obtained by performing Fourier transformation on a product of the second electric field vector and the rotation matrix.