The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2020
Filed:
Apr. 04, 2017
Applicant:
Azbil Corporation, Chiyoda-ku, JP;
Inventors:
Masashi Furuya, Chiyoda-ku, JP;
Daisuke Obara, Chiyoda-ku, JP;
Assignee:
Azbil Corporation, Chiyoda-ku, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 15/14 (2006.01); G01N 21/64 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1436 (2013.01); G01N 15/14 (2013.01); G01N 21/64 (2013.01); G01N 21/65 (2013.01);
Abstract
A particle detecting device includes an inspection light source, which emits inspection light, a flow cell, which is irradiated with the inspection light, and an oval mirror, which has a first focal point at a position of the flow celland has a holeat an apex of the oval mirror
Quick Actions:
Furuya, Masashi. (2020). Particle detecting device and method for inspecting particle detecting device (U.S. Patent No. 10670513). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10670513
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile