The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2020

Filed:

Apr. 03, 2017
Applicant:

Horiba France Sas, Longjumeau, FR;

Inventors:

Simon Richard, Palaiseau, FR;

Sébastien Laden, Bondues, FR;

Dmitri Kouznetsov, Palaiseau, FR;

Assignee:

HORIBA FRANCE SAS, Longjumeau, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/44 (2006.01); G01N 21/64 (2006.01); G01N 21/65 (2006.01); G06T 3/40 (2006.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01J 3/027 (2013.01); G01J 3/2803 (2013.01); G01J 3/44 (2013.01); G01J 3/4406 (2013.01); G01N 21/6458 (2013.01); G01N 21/65 (2013.01); G06T 3/4061 (2013.01); G01J 2003/2813 (2013.01); G01J 2003/2826 (2013.01);
Abstract

Disclosed is a method for acquiring and forming a spectrometry image, including the following steps: a) acquiring an initial structural image of an area of a sample; b) breaking down the initial structural image so as to determine a multi-scale spatial sample of the area of the sample; c) determining a plurality of spectrometry measurement positions in the area of the sample, as a function of the multi-scale spatial sampling determined in step b); d) consecutively, for each spectrometry measurement position determined in step c), positioning the excitation beam and acquiring a spectrometry measurement; and e) reconstructing a spectrometry image point-by-point from the spectrometry measurements acquired in step d).


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