The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2020

Filed:

Jul. 24, 2018
Applicant:

Nuctech Company Limited, Haidian District, Beijing, CN;

Inventors:

Jianhong Zhang, Beijing, CN;

Hongqiu Wang, Beijing, CN;

Li Zhang, Beijing, CN;

Assignee:

NUCTECH COMPANY LIMITED, Haidian District, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01J 3/02 (2006.01); G01N 21/65 (2006.01); G01J 3/10 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0208 (2013.01); G01J 3/021 (2013.01); G01J 3/0202 (2013.01); G01J 3/0227 (2013.01); G01J 3/0229 (2013.01); G01J 3/10 (2013.01); G01J 3/44 (2013.01); G01N 21/65 (2013.01); G01J 2003/4424 (2013.01);
Abstract

A Raman spectrum inspection apparatus is provided, including: a exciting light source configured to emit an exciting light to a sample to be inspected; an optical device configured to collect an optical signal from a position, which is irradiated by the exciting light, of the sample to be inspected; and a spectrometer configured to generate a Raman spectrum of the sample to be inspected from the received optical signal, wherein an excitation optical path in which the exciting light passes from the exciting light device to the sample to be inspected and a detection optical path in which the optical signal received by the spectrometer passes from the sample to be inspected to the spectrometer are separated from each other.


Find Patent Forward Citations

Loading…