The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 2020

Filed:

Aug. 27, 2014
Applicants:

National University of Singapore, Singapore, SG;

Centre National DE LA Recherche Scientifique, Paris, FR;

Inventors:

Virgile Nicolas Robert Viasnoff, Singapore, SG;

Vincent Studer, Paris, FR;

Gianluca Grenci, Singapore, SG;

Remi Galland, Singapore, SG;

Jean-Baptiste Sibarita, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/04 (2006.01); G01N 21/03 (2006.01); B01L 3/00 (2006.01); G01N 21/64 (2006.01); G02B 21/06 (2006.01); G02B 21/00 (2006.01); G02B 21/34 (2006.01); G02B 21/02 (2006.01); G02B 21/16 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
B01L 3/502715 (2013.01); B01L 3/5085 (2013.01); G01N 21/03 (2013.01); G01N 21/031 (2013.01); G01N 21/0303 (2013.01); G01N 21/6458 (2013.01); G02B 21/0076 (2013.01); G02B 21/02 (2013.01); G02B 21/04 (2013.01); G02B 21/06 (2013.01); G02B 21/16 (2013.01); G02B 21/34 (2013.01); G02B 21/361 (2013.01); B01L 2200/0642 (2013.01); B01L 2300/0819 (2013.01); B01L 2300/0822 (2013.01); B01L 2300/0858 (2013.01); B01L 2300/0893 (2013.01); B01L 2300/168 (2013.01); G01N 2201/068 (2013.01);
Abstract

A sample holding device for use in transverse illumination of a sample or sub-components of a sample comprising: a support substrate comprising a sample well adapted to contain and be compatible with said sample wherein said well is provided on at least one wall with an angled reflective surface adjacent said sample well which when in use directs a transverse light beam from a light source through a sample contained within said sample well to provide substantially transverse illumination of a sample contained therein and imaging the sample using a single objective.


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