The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2020
Filed:
Jul. 18, 2018
Edge 3 Technologies, Inc., Phoenix, AZ (US);
Tarek El Dokor, Phoenix, AZ (US);
Jordan Cluster, Tempe, AZ (US);
Joshua King, Mesa, AZ (US);
James Holmes, Mesa, AZ (US);
Milind Subhash Gide, Phoenix, AZ (US);
Edge 3 Technologies, Inc., Phoenix, AZ (US);
Abstract
Multiview calibration is essential for accurate three-dimensional computation. However, multiview calibration can not be accurate enough because of the tolerances required in some of the intrinsic and extrinsic parameters that are associated with the calibration process, along with fundamental imperfections that are associated with the manufacturing and assembly process itself. As a result, residual error in calibration is left over, with no known methods to mitigate such errors. Residual error mitigation is presented in this work to address the shortcomings that are associated with calibration of multiview camera systems. Residual error mitigation may be performed inline with a given calibration approach, or may be presented as a secondary processing step that is more application specific. Residual error mitigation aims at modifying the original parameters that have been estimated during an initial calibration process. These new, modified parameters are then used for triangulation and depth estimation of scene information. This approach also resolves parameter tolerances that are either too cumbersome to measure, or otherwise impossible to measure for practical stereo and multiview camera production and calibration applications.