The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2020
Filed:
Jan. 15, 2019
Litepoint Corporation, Sunnyvale, CA (US);
Christian Volf Olgaard, Saratoga, CA (US);
Ruizu Wang, Santa Clara, CA (US);
LITEPOINT CORPORATION, San Jose, CA (US);
Abstract
System and method of testing performance of a data packet signal transceiver (DUT). Multiple DUT signals, with each having a respective DUT transmit power (RDTPn) received by the tester and corresponding to one (IDTPn) of multiple intended DUT transmit powers, for n=1, . . . , m, with a power equal to a minimum IDTP, maximum IDTP, or intermediate IDTP therebetween. Following association of each RDTPn with its IDTPn, a tester signal is sent having a trigger frame and tester transmit output power (TTOP). The trigger frame includes data corresponding to a reported tester transmit power (RTTP), and a desired signal strength (TRSS) of a DUT data packet signal to be received by the tester. A return DUT signal having a RDTPn is received, from which an IDTPn corresponding to the RDTPn is determined and compared to RTTP-TTOP+TRSS. Successive repetitions of such tester and DUT signals and IDTPn comparisons for multiple combinations of values of the TTOP, RTTP and DRSS enable testing reception performance of the DUT, including extracting RSSI measurements, with minimal signal interactions between tester and DUT.