The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2020

Filed:

Mar. 01, 2018
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Takashi Fuse, Hadano, JP;

Tetsuo Koezuka, Hachioji, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); H04N 5/232 (2006.01); G06T 5/00 (2006.01); G06K 9/00 (2006.01); H04N 5/14 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06K 9/00771 (2013.01); G06T 5/003 (2013.01); G06T 7/001 (2013.01); H04N 5/232 (2013.01); H04N 5/23229 (2013.01); G06T 2207/20201 (2013.01); G06T 2207/30108 (2013.01); H04N 5/144 (2013.01); H04N 5/23264 (2013.01);
Abstract

An abnormal detection apparatus including an imaging unit configured to image generate a first and second image frames included in a first image frame group; a pseudo work generation unit configured to generate the first and a third image frames, the third and the second image frames, or the third and a fourth image frames, included in a second image frame group, respectively, with respect to the first and second image frames included in the first image frame group; a normal space generation unit configured to generate a normal space data based on the first and second image frames included in the first image frame group, and the first and third image frames, the third and second image frames, or the third and fourth image frames, included in the second image frame group; and a comparison unit configured to detect abnormality based on the normal space data.


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