The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2020
Filed:
Mar. 06, 2015
Applicant:
Hitachi, Ltd., Tokyo, JP;
Inventors:
Tohru Watanabe, Tokyo, JP;
Kouichirou Iijima, Tokyo, JP;
Yu Ikemoto, Tokyo, JP;
Youichirou Morita, Tokyo, JP;
Mitsuyoshi Kondo, Tokyo, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 50/06 (2012.01); H02J 3/00 (2006.01); G06Q 30/02 (2012.01);
U.S. Cl.
CPC ...
G06Q 50/06 (2013.01); G06Q 30/0202 (2013.01); H02J 3/00 (2013.01); H02J 2203/20 (2020.01); Y02E 60/76 (2013.01); Y04S 40/22 (2013.01); Y04S 50/14 (2013.01);
Abstract
Proposed is a data analyzing system and method capable of performing highly reliable analytical processing which matches the actual situation. In a data analyzing device and method in which load data is classified into a plurality of clusters in consumer units based on the load data representing the power usage of each consumer for each unit time and the attribute information of each consumer, a diagnostic decision tree is generated for classifying the consumer into one of the clusters based on the attribute information of that consumer.