The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2020

Filed:

Jul. 17, 2018
Applicant:

Shutterfly, Inc., Redwood City, CA (US);

Inventor:
Assignee:

Shutterfly, LLC, Redwood City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6262 (2013.01); G06K 9/00288 (2013.01); G06K 9/6269 (2013.01);
Abstract

A computer-implemented method includes selecting a kernel and kernel parameters for a first Support Vector Machine (SVM) model, testing the SVM model on a feature matrix T of n feature vectors of length m to produce false positive (FP) data set and false negative (FN) data set by a computer processor, wherein n and m are integer numbers, copying the feature matrix T to produce a feature matrix T_best, and checking if a ratio (T_best sample number)/(SVM support vector number) is above a threshold for the SVM model on T_best. If the ratio is above the threshold, SVM predictions are performed using the SVM model on the feature matrix T_best. The first SVM model can be used classify the faces or the objects in the images. An image-product design can be created based on the faces or the objects in the images classified by the first SVM model using the feature matrix T_best.


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