The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2020
Filed:
Jun. 06, 2019
Sas Institute Inc., Cary, NC (US);
Mahesh V. Joshi, Cary, NC (US);
SAS Institute Inc., Cary, NC (US);
Abstract
A computing device provides distributed estimation of an empirical distribution function. A boundary cumulative distribution function (CDF) value is defined at a start of each region of a plurality of regions. An accuracy value is defined for each region. (a) First equal proportion bins are computed for a first sample of a first marginal variable using the defined boundary CDF value for each region. (b) Second equal proportion bins are computed for the first sample of the first marginal variable within each region based on the defined accuracy value for each region. (c) The computed second equal proportion bins are added as an empirical distribution function (EDF) for the first marginal variable. (d) (a) to (c) are repeated for each remaining sample of the first marginal variable. (e) (a) to (d) are repeated with each remaining marginal variable of a plurality of marginal variables as the first marginal variable.