The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2020
Filed:
Oct. 31, 2018
Applicant:
Daihen Corporation, Osaka-shi, Osaka, JP;
Inventors:
Akihiro Ohori, Osaka, JP;
Nobuyuki Hattori, Osaka, JP;
Assignee:
DAIHEN Corporation, Osaka, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G01R 21/133 (2006.01); G01R 19/02 (2006.01);
U.S. Cl.
CPC ...
G06F 17/18 (2013.01); G01R 19/02 (2013.01); G01R 21/133 (2013.01);
Abstract
A measurement apparatus is used in cooperation with another equivalent measurement apparatus. Each measurement apparatus includes a change amount calculator for calculating a change amount of measured values, an average value generator for generating a first internal average value based on the change amount, and a communication unit for receiving a second internal average value that was generated by at least one other measurement apparatus. The average value generator generates a third internal average value, using a computation result based on at least the first and second internal average values.