The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2020

Filed:

Mar. 15, 2017
Applicant:

The Regents of the University of Colorado, a Body Corporate, Denver, CO (US);

Inventors:

Juin-Yann Yu, Boulder, CO (US);

Carol J. Cogswell, Boulder, CO (US);

Simeng Chen, Boulder, CO (US);

Robert H. Cormack, Erie, CO (US);

Jian Xing, Boulder, CO (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 27/58 (2006.01); G02B 21/00 (2006.01); G02B 27/00 (2006.01); G01N 21/64 (2006.01); G02B 21/36 (2006.01); G06T 3/40 (2006.01);
U.S. Cl.
CPC ...
G02B 27/58 (2013.01); G01N 21/6458 (2013.01); G02B 21/002 (2013.01); G02B 21/367 (2013.01); G02B 27/0075 (2013.01); G06T 3/4053 (2013.01);
Abstract

Apparatus and methods for super-resolution imaging of extended objects utilize a scanned illumination source with a small spot size. Sub-images composed of highly-overlapping point spread functions are captured and each sub-image is iteratively compared to a series of brightness combinations of template point spread functions in a dictionary. The dictionary is composed of highly-overlapping point spread functions. Each sub-image is associated with a best-match template combination solution, and the best-match reconstructions created by best-match solutions are combined into a super-resolution image of the object.


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