The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2020

Filed:

Sep. 08, 2017
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Thomas Kluge, Hirschaid, DE;

Mathias Nittka, Baiersdorf, DE;

Gregor Koerzdoerfer, Erlangen, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/48 (2006.01); G01R 33/561 (2006.01); G01R 33/54 (2006.01); G01R 33/56 (2006.01); G06T 11/00 (2006.01); G01R 33/58 (2006.01);
U.S. Cl.
CPC ...
G01R 33/4818 (2013.01); G01R 33/4828 (2013.01); G01R 33/546 (2013.01); G01R 33/561 (2013.01); G01R 33/5608 (2013.01); G06T 11/005 (2013.01); G01R 33/4806 (2013.01); G01R 33/58 (2013.01); G06T 11/003 (2013.01);
Abstract

In order to execute a low-artifact magnetic resonance fingerprinting (MRF) scan, a preferred order of N k-space trajectories of a sampling pattern is determined in a computer, along which in each case an undersampled scan data set is to be scanned, such that artifacts are avoided in parameter maps created from the scan data sets in an MRF scan. The order in which the N k-space trajectories are to be sampled one after the other is varied, so at least two different orders are produced. According to the orders that result due to this variation, determined test signal characteristics are compared with each other and/or with ideal signal characteristics with respect to their artifact behavior. A preferred order is determined from the resulting orders by taking into account the results of the comparison.


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