The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2020
Filed:
Jul. 10, 2018
Applicants:
Alexander A. Ukhanov, Albuquerque, NM (US);
Gennady A. Smolyakov, Albuquerque, NM (US);
Inventors:
Alexander A. Ukhanov, Albuquerque, NM (US);
Gennady A. Smolyakov, Albuquerque, NM (US);
Assignee:
ACTOPROBE LLC, Albuquerque, NM (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/40 (2010.01); G01Q 60/42 (2010.01); H01S 5/183 (2006.01); G01Q 60/06 (2010.01); G01Q 70/02 (2010.01); H01S 5/022 (2006.01); G01Q 70/10 (2010.01);
U.S. Cl.
CPC ...
G01Q 60/40 (2013.01); G01Q 60/06 (2013.01); G01Q 60/42 (2013.01); G01Q 70/02 (2013.01); G01Q 70/10 (2013.01); H01S 5/02268 (2013.01); H01S 5/183 (2013.01);
Abstract
A new resonant-cavity-enhanced Atomic Force Microscopy (AFM) active optical probe integrates a semiconductor laser source and an aperture AFM/near-field scanning optical microscopy (NSOM) probe in either external-resonant-cavity or internal-resonant-cavity configuration to enable both conventional AFM measurements and optical imaging and spectroscopy at the nanoscale.