The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2020
Filed:
Jan. 09, 2018
Nuctech Company Limited, Haidian District, Beijing, CN;
Tsinghua University, Haidian District, Beijing, CN;
Qiang Li, Beijing, CN;
Jianping Gu, Beijing, CN;
Bin Xu, Beijing, CN;
Yaohong Liu, Beijing, CN;
Ziran Zhao, Beijing, CN;
Nuctech Company Limited, Haidian District, Beijing, CN;
Tsinghua University, Haidian District, Beijing, CN;
Abstract
A method for inspecting a container and an inspection device are disclosed. X-ray scanning is performed on the inspected container to obtain a scanned image. The scanned image is processed to obtain a region of interest. Features of texture units included in the region of interest are calculated. Local descriptions of the texture units are formed based on the features of the texture units. Distinction of each local point is calculated from a local description of each of the texture units so as to obtain a local distinct map of the region of interest. It is determined whether there is an article which is secretly carried in the inspected container using the local distinct map.