The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2020
Filed:
Jan. 30, 2018
Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
An optical analysis apparatus, that irradiates a liquid sample with light and analyzes the sample, includes a measurement unit that measures the sample, a light source portion that emits light with which the sample is irradiated, and a light receiving portion that receives the light transmitted through the sample. The measurement unit includes a housing provided with an opening portion for flowing in and out of the sample, an accommodation region connected to the opening portion and provided inside the housing, a movable portion provided inside the accommodation region to be movable inside the accommodation region, an irradiation portion which receives the light emitted from the light source portion and in which an inside of the accommodation region is irradiated with the light, and a light collection portion which collects the light transmitted through the sample inside the accommodation region and outputs the light to the light receiving portion.