The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2020
Filed:
Jul. 28, 2016
Carrier Corporation, Jupiter, FL (US);
Lei Chen, South Windsor, CT (US);
Zhiwei Yang, South Windsor, CT (US);
Farley William Postgate, Syracuse, NY (US);
Warren Clough, Cicero, NY (US);
Ivan Rydkin, Rochester, NY (US);
CARRIER CORPORATION, Palm Beach Gardens, FL (US);
Abstract
A method and an analyzer for detecting impurities in refrigerant (e.g. methyl chloride (R40) or Chlorodifiuoromethane (R22)), wherein the refrigerant analyzer () includes a first sensing device (), preferably a non-dispersive infrared sensor (NDIR), in flow communication with a second sensing device (), preferably an electrochemical sensor. The first sensing device is configured to determine a first characteristic of a refrigerant (e.g. absorbance in the IR range), and the second sensing device is configured to detect a second characteristic of the refrigerant (e.g. concentration in ppmv). Preferably, the refrigerant analyzer is a part of a system for detecting impurities () and further preferably it comprises flow regulators (), a scrubber () and a processor (). The scrubber is preferably in flow communication with the first sensing device and it preferably comprises a packing material comprising alumina (Al2O3, aluminum oxide).