The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2020
Filed:
Dec. 29, 2017
Nuctech Company Limited, Beijing, CN;
Haihui Liu, Beijing, CN;
Hongqiu Wang, Beijing, CN;
Yumin Yi, Beijing, CN;
Jianhong Zhang, Beijing, CN;
Ankai Wang, Beijing, CN;
Nuctech Company Limited, Beijing, CN;
Abstract
An embodiment of the present disclosure provides a spectrum inspecting apparatus. The apparatus includes a laser source; a focusing cylindrical lens configured to converge a light beam onto a sample; a light beam collecting device configured to collect a light beam signal, which is excited by the light beam, from the sample, so as to form a strip-shaped light spot; a slit configured to receive the collected light beam and couple it to downstream of a light path; a collimating device; a dispersing device configured to disperse the collected light beam so as to form a plurality of sub-beams having different wavelengths; an imaging device configured to image the sub-beams on the photon detector array respectively, wherein the light beam emitted from the laser source has a rectangular cross-section, the strip-shaped light spot impinges on the slit and its length is smaller than a length of the slit.