The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2020
Filed:
Nov. 02, 2017
Korea Aerospace Research Institute, Daejeon, KR;
Jung Jin Lee, Daejeon, KR;
Joong Wook Kim, Daejeon, KR;
KOREA AEROSPACE RESEARCH INSTITUTE, Daejeon, KR;
Abstract
A drop testing apparatus is provided. The drop testing apparatus includes a plate connected to an external crane, a magnet holder provided at one end of the plate and fixed to the plate by an electromagnetic force, a counterweight provided at another end of the plate and facing the magnet holder, a dummy structure connected to the magnet holder through a connecting member and having a test specimen installed at one side thereof, a load cell unit provided between the dummy structure and the test specimen to measure impulse of the test specimen, and a controller configured to control the electromagnetic force to be created in the magnet holder and to receive the impulse measured by the load cell unit. When the electromagnetic force is cancelled, the connecting member disengages from the magnet holder, and the dummy structure and the test specimen fall onto the ground.