The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2020
Filed:
Jul. 31, 2019
Faro Technologies, Inc., Lake Mary, FL (US);
Simon Raab, Santa Barbara, CA (US);
Bernd-Dietmar Becker, Ludwigsburg, DE;
Rolf Heidemann, Stuttgart, DE;
Steffen Kappes, Oedheim-Degmarn, DE;
João Santos, Kornwestheim, DE;
Oliver Zweigle, Stuttgart, DE;
Aleksej Frank, Stuttgart, DE;
FARO TECHNOLOGIES, INC., Lake Mary, FL (US);
Abstract
An inspection system for measuring an object is provided. The inspection system includes an entryway sized to receive the object. At least two non-contact coordinate measurement devices are positioned with a field of view being at least partially within or adjacent to the entryway, each of the at least two non-contact coordinate measurement devices being operable to measure 3D coordinates for a plurality of points on the object as one of the object or the entryway move from a first position to a final position. A pose measurement device is operable to determine the six-degree of freedom (6DOF) pose of the object. One or more processors are provided that register the 3D coordinates for the plurality of points from each of the at least two non-contact coordinate measurement devices based at least in part on the 6DOF pose of the object.