The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2020

Filed:

Jul. 05, 2018
Applicant:

Hexagon Metrology, Inc., North Kingstown, RI (US);

Inventors:

Paul Ferrari, Carlsbad, CA (US);

Hyun Kwon Jung, Oceanside, CA (US);

Assignee:

Hexagon Metrology, Inc., North Kingstown, RI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/008 (2006.01); G01B 11/00 (2006.01); G01B 21/04 (2006.01);
U.S. Cl.
CPC ...
G01B 11/005 (2013.01); G01B 5/008 (2013.01); G01B 11/007 (2013.01); G01B 21/04 (2013.01); G01B 21/047 (2013.01);
Abstract

A multi-mode coordinate measuring machine system can be configured to measure coordinates in a variety of ways with a certain set of components. For example, an articulated arm coordinate measuring machine can measure coordinates on an object using a contact probe or a non-contact measuring device mounted on the articulated arm. Then, a user can remove the non-contact measuring device from the articulated arm coordinate measuring machine, and take additional measurements of the object that can be aligned with measurements taken by the articulated arm and devices attached thereto.


Find Patent Forward Citations

Loading…