The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2020

Filed:

Sep. 29, 2017
Applicants:

Siemens Healthcare Gmbh, Erlangen, DE;

Siemens Medical Solutions Usa, Inc., Malvern, PA (US);

Inventors:

Ingmar Voigt, Erlangen, DE;

Tommaso Mansi, Plainsboro, NJ (US);

Helene C. Houle, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); G06T 7/62 (2017.01); A61B 8/08 (2006.01); A61B 6/03 (2006.01); A61B 34/20 (2016.01); A61B 5/055 (2006.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
A61B 8/466 (2013.01); A61B 8/463 (2013.01); A61B 8/483 (2013.01); G06T 7/62 (2017.01); A61B 5/055 (2013.01); A61B 6/032 (2013.01); A61B 8/462 (2013.01); A61B 2034/2065 (2016.02); A61B 2090/376 (2016.02); A61B 2090/378 (2016.02); A61B 2576/00 (2013.01); G06T 2207/30048 (2013.01);
Abstract

For measurement point determination in imaging with a medical scanner, the user selects a location on the image. Rather than using that location, an 'intended' location corresponding to a local boundary or landmark represented in the image is identified. The medical scanner uses the simple user interface to more exactly determine points for measurement. One or more rays are cast from the user selected location. The actual location is found by examining data along the ray or rays. For 2D imaging, the rays are cast in the plane. For 3D imaging, the ray is cast along a view direction to find the depth. The intensities along the ray or around the ray are used to find the actual location, such as by application of a machine-learnt classifier to the limited region around the ray or by finding intensities along the ray relative to a threshold.


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