The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 2020
Filed:
Jun. 16, 2017
Koninklijke Philips N.v., Eindhoven, NL;
Rolf Karl Otto Behling, Norderstedt, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The present invention relates to an apparatus () for imaging an object. It is described to position () an X-ray detector relative to at least one X-ray source such that at least a part of a region between the at least one X-ray source and the X-ray detector is an examination region for accommodating an object. In a first mode of operation, with the at least one X-ray source a first focal spot is produced (), such that at least some first X-rays produced at the first focal spot pass through a first grating of an interferometer arrangement, the first grating positioned at a first position, and such that the at least some first X-rays pass through a second grating of the interferometer arrangement, the second grating positioned at a second position. In the first mode of operation, the at least some first X-rays are detected () with the X-ray detector at a detector position. In a second mode of operation, with the at least one X-ray source a second focal spot is produced (), such that at least some second X-rays produced at the second focal spot avoid the first grating at the first position. In the second mode of operation, the at least some second X-rays are detected () with the X-ray detector at the detector position.