The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2020

Filed:

May. 16, 2018
Applicant:

Ziehm Imaging Gmbh, Nürnberg, DE;

Inventors:

Thomas König, Nürnberg, DE;

Christof Fleischmann, Möhrendorf, DE;

Eva-Maria Ilg, Nürnberg, DE;

Lena Lochner, Nürnberg, DE;

Assignee:

Ziehm Imaging GmbH, Nürnberg, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/10 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4441 (2013.01); A61B 6/03 (2013.01); A61B 6/102 (2013.01); A61B 6/4085 (2013.01); A61B 6/5205 (2013.01); A61B 6/4405 (2013.01); A61B 6/467 (2013.01);
Abstract

This disclosure generally relates to a method and an apparatus for recording a 3D data set of an ROI () complete in the central layer by using a cone-beam C-arm X-ray apparatus () having a cone beam () with a cone angle () in the plane of the C-arm and having a virtual scan center () in the center of the ROI (), wherein the scan is performed with a trajectory pair situated in the virtual scan center () and composed of a focus trajectory and a detector trajectory and wherein the rotational portion () of the detector trajectory is formed from piece-wise defined superellipses.


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