The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2020
Filed:
Feb. 14, 2019
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventor:
Sekito Masaru, Kitakyushu, JP;
Assignee:
Seiko Epson Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01); B65H 5/06 (2006.01); B65H 7/14 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00726 (2013.01); B65H 5/062 (2013.01); B65H 7/14 (2013.01); H04N 1/00732 (2013.01); H04N 1/00734 (2013.01); H04N 1/00777 (2013.01); H04N 1/00779 (2013.01);
Abstract
A medium feeding device includes: a placement unit on which a medium is placed; a feeding section that feeds the medium placed on the placement unit; a wrinkle detection section that is provided on a further upstream side than the feeding section in a feeding direction and outputs a detection value in accordance with a wrinkle in the medium; and a control section that performs predetermined control on the basis of the detection value of the wrinkle detection section and stops the feeding section in a case in which the detection value output from the wrinkle detection section exceeds a predetermined allowable value.