The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2020

Filed:

Jul. 17, 2019
Applicant:

Telefonaktiebolaget Lm Ericsson (Publ), Stockholm, SE;

Inventors:

Torbjörn Elfström, Fjärås, SE;

Ove Nilsson, Ulricehamn, SE;

Lars Persson, Åsa, SE;

Moritz Saarman, Mölnlycke, SE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04B 17/10 (2015.01);
U.S. Cl.
CPC ...
H04B 17/101 (2015.01); H04B 17/0087 (2013.01);
Abstract

The embodiments herein relate to a method performed by a testing device for enabling testing of a communication node. The testing device measures a test parameter associated with RF characteristics of the communication node when it is located at a test location during a first condition. The communication node is configured with a node setting during the measurement in the first condition. The testing device measures the test parameter associated with the RF characteristics of the communication node when it is located at the test location during a second condition. The communication node is configured with the same node setting in the second condition as in the first condition. The testing device checks whether a result parameter associated with the test parameter measured during the first and second condition fulfills a requirement.


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