The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2020

Filed:

Feb. 24, 2016
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventor:

Gilad Shechter, Haifa, IL;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/008 (2013.01); G06T 11/006 (2013.01); G06T 2211/408 (2013.01); G06T 2211/421 (2013.01);
Abstract

A method includes generating a material landmark images in a low and high energy image domain. The material landmark image estimates a change of a value of an image pixel caused by adding a small amount of a known material to the pixel. The method further includes generating an air values image in the low and high energy image domain. The air values image estimates a value for each image pixel where a value of a pixel is replaced by a value representing air. The method further includes extracting from de-noised low and high images generated from the low and high line integrals, a material composition of each image pixel based on the material landmark images and air values image. The method further includes generating a signal indicative the extracted material composition.


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