The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2020
Filed:
Apr. 12, 2019
Advanced Vision Technology (A.v.t.) Ltd., Hod Hashron, IL;
Maya Dekel-Klein, Hod Hasharon, IL;
Chanan Gazala, Kfar Saba, IL;
Advanced Vision Technology (A.V.T.) Ltd., Hod Hashron, IL;
Abstract
Method for generating a test-set for inspection of a design being printed by a printing-press, each color-unit in the printing-press prints a respective color. The design is composed of original-layers. Inspection includes determining the origin of at least one defect in the printed-design. The method includes the procedures of generating defective-layer or layers of the design, by introducing at least one selected defect to at least one selected original-layer, in a selected location or locations and combining layers using a trained-synthesis-neural-network. The layers include the defective-layer or layers and remaining ones of the original-layers. The trained-synthesis-neural-network provides a plurality of features respective of each pixel. The method also includes the procedure of generating the test-set from the output of the synthesis-neural-network. The test-set includes at least one synthesized-test-image. The synthesized-test-image includes at least one synthesized-defect at the selected location. The test-set is employed to determine the origin of the defect.