The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2020
Filed:
Mar. 14, 2018
Hitomi Kaneko, Saitama, JP;
Hitomi Kaneko, Saitama, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An inspection apparatus includes circuitry to acquire a reference image used for inspecting a printed matter, acquire a scanned image by scanning the printed matter, generate a difference image indicating a difference between the acquired reference image and the acquired scanned image, extract an edge region from the reference image, detect a proximity region located near the edge region, correct an inspection threshold to be applied to a pixel defining the edge region based on a density difference and a distance between the pixel defining the edge region and an influencing pixel set the proximity region, and an inspection threshold to be applied to a pixel defining the proximity region based on a density difference and a distance between the pixel defining the proximity region and an influencing pixel in the edge region, and inspect the printed matter based on the generated difference image and the corrected inspection threshold.