The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2020
Filed:
Jun. 05, 2019
Aon Global Operations Ltd. (Singapore Branch), Singapore, SG;
Stephen Fiete, Evanston, IL (US);
Alok Bhattacharya, Chicago, IL (US);
Aon Global Operations Ltd. (Singapore Branch), Singapore, SG;
Abstract
In an illustrative embodiment, systems and methods for calculating risk scores for locations potentially affected by catastrophic events include receiving a risk score request for a location, the risk score request including a request for assessment of risk exposure related to a type of catastrophic event. Based on the type of catastrophic event, a data compression algorithm may be applied to a catastrophic risk model representing amounts of perceived risk to an area surrounding the location. In response to receiving the risk score request, a risk score for the location may be calculated that corresponds to a weighted estimation of one or more data points in a compressed catastrophic risk model. A risk score user interface screen may be generated in real-time to present the catastrophic risk score and one or more corresponding loss metrics for the location due to a potential occurrence of the type of catastrophic event.