The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2020

Filed:

Jul. 14, 2017
Applicant:

Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);

Inventors:

Ulugbek Kamilov, Cambridge, MA (US);

Hassan Mansour, Boston, MA (US);

Dehong Liu, Lexington, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06N 3/084 (2013.01); G06T 11/003 (2013.01); G06T 11/006 (2013.01); G06T 2207/20084 (2013.01);
Abstract

Systems and methods for a computer implemented image reconstruction system that includes an input interface to receive measurements of a scene. A memory to store a sparsity enforcing neural network (SENN) formed by layers of nodes propagating messages through the layers. Wherein at least one node of the SENN modifies an incoming message with a non-linear function to produce an outgoing message and propagates the outgoing message to another node of the SENN. Wherein the non-linear function is a dual-projection function that limits the incoming message if the incoming message exceeds a threshold. Such that, the SENN is trained to reconstruct an image of the scene from the measurements of the scene. A processor to process the measurements with the SENN to reconstruct the image of the scene. Finally, an output interface to render the reconstructed image of the scene.


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