The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2020

Filed:

Mar. 27, 2019
Applicant:

Idaho State University, Pocatello, ID (US);

Inventors:

John Kalivas, Pocatello, ID (US);

Rene Rodriguez, Pocatello, ID (US);

Ikwulono David Unobe, Pocatello, ID (US);

Lisa Lau, Idaho Falls, ID (US);

Assignee:

Idaho State University, Idaho Falls, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06T 7/00 (2017.01); H04N 5/33 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6215 (2013.01); G06K 9/6202 (2013.01); G06K 9/623 (2013.01); G06K 9/6247 (2013.01); G06K 9/6288 (2013.01); G06T 7/001 (2013.01); H04N 5/33 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/30136 (2013.01);
Abstract

Methods for identifying marks in a defaced metal surface by use of computer-implemented processing of images obtained according to a thermal lock-in imaging technique are described. Methods include processing phase images and/or amplitude images according to principal component analysis of a concatenated input matrix and development of a score image for each principal component determined by the analysis. Score images or extracted features of score images (e.g., Zernike moments) are compared to images/features in a reference data library and based upon the comparison, the defaced mark can be identified.


Find Patent Forward Citations

Loading…