The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2020
Filed:
Apr. 07, 2017
International Business Machines Corporation, Armonk, NY (US);
Vatche Ishakian, Belmont, MA (US);
Vinod Muthusamy, Peekskill, NY (US);
Aleksander Slominski, Riverdale, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A method of generating process trace clusters includes receiving a set of process traces, where a process trace is an application level event log from a computer system; receiving an identification of node types and edge types of the application event log to generate a heterogeneous information network (HIN) graph, where a temporal node type value is a difference between a current system time and a reference timestamp divided by a user chosen time granularity parameter, performing dimension reduction of the HIN to generate clusters of new event types, generating a set of meta-paths that connect nodes of a same reduced event type in the application event log, calculating similarities between process traces using the new event type clusters, and clustering the set of process traces to generate a plurality of disjoint graph models of processes in the application event log based on the clusters of new event types.