The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2020
Filed:
Dec. 04, 2015
Safran Aircraft Engines, Paris, FR;
Olivier Ferry, Moissy-Cramayel, FR;
Arnaud Cambefort, Moissy-Cramayel, FR;
Pascal Courtin, Moissy-Cramayel, FR;
Nicolas Hardouin, Moissy-Cramayel, FR;
Charles Cleret De Langavant, Moissy-Cramayel, FR;
SAFRAN AIRCRAFT ENGINES, Paris, FR;
Abstract
The invention pertains to a method of manufacturing parts produced with a manufacturing device, based on the analysis of at least one statistical indicator representative of a characteristic dimension of the parts, according to which: a) in the course of time several samples are collected, each sample comprising several parts produced with the manufacturing device; b) the characteristic dimension of each part of the sample is measured; c) for each sample collected a weighted mean and a weighted standard deviation of the characteristic dimension are calculated according to an exponential weighting on the basis of a mean and standard deviation of the characteristic dimensions measured on the parts of said sample, of weighted means and of weighted standard deviations of the characteristic dimension which are calculated for previously collected samples; d) for each sample collected a value of the statistical indicator is calculated on the basis of the weighted mean and of the weighted standard deviation thus calculated; e) a value of the statistical indicator thus calculated for the sample collected is compared with a reference value to detect a possible deviation; f) the manufacture of the parts is steered as a function of the results of the comparison by fitting the manufacturing device adjustment parameters to optimize the deviation between the value of the statistical indicator and the reference value.