The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2020

Filed:

Sep. 07, 2016
Applicant:

American Science and Engineering, Inc., Billerica, MA (US);

Inventors:

Lee Grodzins, Lexington, MA (US);

Dan-Cristian Dinca, Chelmsford, MA (US);

Martin Rommel, Lexington, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 5/00 (2006.01); G01N 23/20008 (2018.01); G21K 1/02 (2006.01); H01J 35/14 (2006.01);
U.S. Cl.
CPC ...
G01V 5/0025 (2013.01); G01N 23/20008 (2013.01); G21K 1/02 (2013.01); G01N 2223/639 (2013.01); H01J 35/14 (2013.01);
Abstract

Methods and an x-ray source for sweeping an x-ray beam across an object of inspection. A beam of electrons is emitted by a cathode, while a sweep controller applies a signal to a beam controller in a prescribed path on an anode, thereby causing an x-ray beam to be emitted from an aperture disposed at one apex of a snout of variable length. The aperture may be a Rommel aperture that allows for forming a scanning x-ray of desired size and flux independently of the angle at which the beam is emitted. Scanning rate may be varied during the course of a scan. Multiple x-ray beams may be formed simultaneously, where one beam is inside a conveyance while the other is outside the conveyance, for example.


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