The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2020

Filed:

Apr. 03, 2019
Applicant:

Battelle Memorial Institute, Richland, WA (US);

Inventors:

David W. Gotthold, Richland, WA (US);

Andrew J. Stevens, Richland, WA (US);

Nigel D. Browning, Richland, WA (US);

Eric Jensen, Richland, WA (US);

Nathan L. Canfield, Richland, WA (US);

Alan G. Joly, Richland, WA (US);

Assignee:

Battelle Memorial Institute, Richland, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/115 (2006.01); G06F 3/03 (2006.01); G01T 1/00 (2006.01);
U.S. Cl.
CPC ...
G01T 1/115 (2013.01); G01T 1/00 (2013.01); G06F 3/0325 (2013.01);
Abstract

A method includes directing a probe beam to a target that includes an array of data portions in a data storage medium arranged so that a beam area of the probe beam extends across a plurality of adjacent data portions, the array including a data portion subset with each data portion of the subset responsive to the probe beam to produce a response illumination, receiving the response illumination at a detector, and determining data values corresponding to the plurality of adjacent data portions based on the received response illumination. Apparatus and systems are also disclosed.


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