The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2020

Filed:

May. 09, 2016
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Patrick Gross, Eindhoven, NL;

Miha Fuderer, Eindhoven, NL;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/389 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/389 (2013.01); G01R 33/56518 (2013.01); G01R 33/56563 (2013.01);
Abstract

A magnetic resonance examination system is disclosed comprising a field probe system to measure the magnetic field distribution of the main magnetic field and gradient magnetic field. The measurements are made in an earlier configuration and yield the resultant magnetic field due to gradient switching or external causes. From the measured resultant magnetic field the response relation is derived and stored in the memory. The response relation from the memory is available for compensating activation of the gradient fields or correction in reconstruction for the response relation in reconstruction. This compensation or correction can be carried-out in a current configuration. Thus is the current configuration to field probes are needed.


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