The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2020
Filed:
May. 15, 2017
Applicant:
Amazon Technologies, Inc., Seattle, WA (US);
Inventors:
Prashanth Basavaraj Patil, Santa Clara, CA (US);
San-Ching De La Cruz, Santa Clara, CA (US);
Assignee:
Amazon Technologies, Inc., Seattle, WA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/08 (2012.01); G01R 31/319 (2006.01); G01R 31/01 (2020.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31905 (2013.01); G01R 31/01 (2013.01); G01R 31/2834 (2013.01); G01R 31/31908 (2013.01);
Abstract
A multi-function test machine includes a table assembly, a robotic arm, one or more stimulators, one or more sensors, and a computing device for testing electronic devices. The multi-function tester may also include a camera test assembly and a universal device holder. The multi-function tester is capable of testing multiple systems of an electronic device concurrently, thus obviating the need for multiple test stations and operators.