The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2020

Filed:

May. 03, 2018
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventors:

Takuya Lee, Tokyo, JP;

Tetsuya Kokubun, Tokyo, JP;

Yutaka Nakadai, Tokyo, JP;

Kenji Shiozawa, Ibaraki, JP;

Yoshihide Nakamura, Ibaraki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/20 (2006.01); G06F 11/27 (2006.01); G01R 31/3167 (2006.01); G01R 31/3187 (2006.01); G06F 15/78 (2006.01);
U.S. Cl.
CPC ...
G01R 31/3167 (2013.01); G01R 31/3187 (2013.01); G06F 11/202 (2013.01); G06F 11/27 (2013.01); G06F 15/78 (2013.01);
Abstract

According to one embodiment, a semiconductor device performs processing based on a user program by using a user program, which is used in a normal mode, as an analysis program and making a plurality of peripheral circuits having the same function operate in lock-step where the plurality of peripheral circuits operate in the identical manner, and makes failure diagnosis of the peripheral circuits by determining match or mismatch of a plurality of analysis information respectively obtained from the plurality of peripheral circuits operating in lock-step.


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