The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2020
Filed:
Feb. 14, 2018
Ohio State Innovation Foundation, Columbus, OH (US);
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Sajith M. Dharmasena, Nawala, LK;
Seok Kim, Champaign, IL (US);
Lawrence A. Bergman, Champaign, IL (US);
Alexander F. Vakakis, Champaign, IL (US);
Hanna Cho, Dublin, OH (US);
Ohio State Innovation Foundation, Columnbus, OH (US);
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Abstract
A cantilever system for use in an atomic force microscope (AFM) is disclosed. The cantilever system comprises a base cantilever portion and a paddle connected to the base cantilever portion with one end free to move relative to the base cantilever portion. The base cantilever portion has an effective bending stiffness, k, and the paddle has an effective bending stiffness, k. The ratio of the effective bending stiffness, k, to the bending stiffness, k, is at least greater than 4. Such a cantilever system provides a stable, i.e., invariant contact resonant frequency, independent of the changes in the local contact stiffness.